Functional nanowire microscopy tip
Kim J., Shin Y-H, Yun J.H., Han C-S, Hyun M.S., Korea Institute of Machinery and Materials (KIMM), KR
Excellent electric conductive nickel silicide (NiSi) nanowire (NW) was aligned on a conventional Si tip and performed as an electric force microscopy (EFM) probe. Single crystalline structured NiSi NW was grown in plasma-enhanced chemical vapor [...]