Salapaka M.V. – TechConnect Briefs

Thermal Noise Response Based Static Non-Contact Atomic Force Microscopy

Gannepalli A., Sebastian A., Salapaka M.V., Cleveland J., Iowa State University, US

Micro-cantilever based devices have revolutionized imaging and they are the primary tools for investigation and control of matter at the nanoscale. In this paper a novel approach based on the thermal noise response of the [...]

An Ultra-Fast Scheme for Sample-Detection in Dynamic-Mode Atomic Force Microscopy

Sahoo D.R., Sebastian A., Salapaka M.V., Iowa State University, US

In typical dynamic mode operation of atomic force microscopes steady state signals like amplitude and phase are used for detection and imaging of material. In these methods, high quality factor of the cantilever results in [...]