Saha S.K. – TechConnect Briefs

Process Variability Modeling for VLSI Circuit Simulation

Saha S.K., SuVolta, Inc., US

It is well known that the process variability has severely impacted the delay and power variability in VLSI devices, circuits, and chips, and the impact of process variability keeps increasing as MOSFET devices and CMOS [...]

Change of 7Be decay rate in exohedral and endohedral C60 fullerene

Ray A., Das J.J., Das P., Saha S.K., Das J.J., Das P., Madhavan N., Variable Energy Cyclotron Center, IN

We have measured the change of decay rate of 7Be in different environments including in atomic clusters such as fullerene C60. It has been found that the decay rate depends on the geometrical position of [...]