Reliable nanoscale electrical characterization using Graphene-coated Atomic Force Microscope tips
Lanza M., Bayerl A., Reguant M., Lv P., Rubio C., Porti M., Nafria M., Duan H.L., Peking University, CN
Electrical characterization at the nanoscale is an essential procedure for analyzing the performance of many materials used at both industry and academia. In this field, one of the most powerful tools is the Conductive Atomic [...]