Moeck P. – TechConnect Briefs

Automated Crystal Orientation and Phase Mapping of Iron Oxide Nano-Crystals in a Transmission Electron Microscope

Rouvimov S., Rauch E.F., Moeck P., Nicolopoulos S., Portland State University, US

An automated technique for the crystal phase and orientation mapping of polycrystalline materials in a TEM has recently beam developed. This technique is based on template matching of experimental electron diffraction spot patterns to their [...]

Structural Fingerprinting of Nanocrystals in the Transmission Electron Microscope

Moeck P., Rouvimov S., Nicolopoulos S., Portland State Unversity, US

Three novel strategies for the structurally identification of nanocrystals in a Transmission Electron Microscope (TEM) are presented. Either a single High-Resolution Transmission Electron Microscopy (HRTEM) image or a single Precession Electron Diffractogram (PED) can be [...]

Structural fingerprinting of nano-crystals based on high resolution transmission electron microscopy imaging: challenges and perspectives

Rouvimov S., Moon B., Moeck P., Portland State University, US

The methods for structure identification and analysis of nanocrystalline particles are in high demand for nanotechnology and nanofabrication, areas that require fast, reliable and robust metrologies for nanometer-sized objects. High-resolution (HR) transmission electron microscopy (TEM) [...]

Quantifying and enforcing the two-dimensional symmetry of scanning probe microscopy images of periodic objects

Moeck P., Moon Jr. B., Sánchez E., Abdel-Hafiez M., Hietschold M., Portland State University, US

The defining features of a scanning probe microscope are a very fine probe that is scanned in two dimensions (2D), in very fine steps, very close to the surface of a sample, and a probe-sample [...]

Identification of individual nanocrystal structures and morphologies by TEM

Moeck P., Portland State University, US

Two novel methods for the structurally identification of a nanocrystal from either a single high resolution (HR) transmission electron microscopy (TEM) micrograph or a single electron precession diffractogram are described. While the structural information that [...]

Image-based Nanocrystallography in Two and Three Dimensions with

Moeck P., Bjorge R., Fraundorf P., Portland State University, US

It is well known that many nanocrystals can not be identified from their powder X-ray diffraction pattern as it is customary for collections of micrometer sized crystals. The crystallographic phase and shape of nanocrystals can, [...]

Lattice Fringe Fingerprinting in Two Dimensions with Database Support

Moeck P., Seipel B., Bjorge R., Fraundorf P., Portland State University, US

Direct space high-resolution phase-contrast transmission electron microscopy (HRTEM) and atomic resolution Z-contrast scanning TEM (Z-STEM), when combined with tools for image-based nanocrystallography possess the capacity to derive the crystallographic phase and shape of nanocrystals. This [...]

Structural and Morphological Transformations in Self-Assembled Sn Quantum Dots in Si Matrix

Moeck P., Lei Y., Topuria T., Browning N.D., Ragan R., Min K.S., Atwater H.A., Portland State University, US

Transmission electron microcopy (TEM) in both the parallel illumination and scanning probe mode (i.e. STEM) has revealed morphological and structural transformations in self-assembled II-VI, III-V and group IV semiconductor quantum dots (QDs). These transformations result [...]