McElfresh M. – TechConnect Briefs

Modeling AFM Induced Mechanical Deformation of Living Cells

Rudd R.E., McElfresh M., Balhorn R., Allen M., Belak J., Lawrence Livermore National Laboratory, US

One challenge with using Atomic Force Microscopy (AFM) for recognition microscopy on living cells is the fact that the cell is not rigid, and as the force is applied to a receptor site, it is [...]

Modeling of the Deformation of Living Cells Induced by Atomic Force Microscopy

Rudd R.E., McElfresh M., Baesu E., Balhorn R., Alleny M., Belak J., Lawrence Livermore National Lab., US

We describe finite element modeling of the deformation of living cells by atomic force microscopy (AFM). Cells are soft systems, susceptible to large deformations in the course of an AFM measurement. Often the local properties, [...]

Design of Piezoresistive Silicon Cantilevers with Stress Concentration Regions (SCR) for Scanning Probe Microscopy (SPM) Applications

Gupta A., Bashir R., Neudeck G.W., McElfresh M., Purdue University, US

This paper describes and evaluates the incorporation of novel Stress Concentration Region (SCR) in silicon based cantilevers to enhance piezoresistive displacement, force, and torque sensitivities. In brief, SCR is a region, on the cantilever, with [...]