Lu Y-W – TechConnect Briefs

A Line Force Model to Measure the Strength of Polydimethylsiloxane (PDMS)-to-PDMS Bonding in Blister Tests

Lin P-T, Lu Y-W, Rutgers University, US

Bonding is an important technique in microelectronics and Microelectromechanical Systems (MEMS). Especially, bonding two pieces of polydimethylsiloxane (PDMS) to make micro devices was widely used in micro actuators and BioMEMS. The PDMS bonding, however, lacked [...]

Negative-Poisson’s-Ratio (NPR) Microstructural Material by Soft-Joint Mechanism

Lu Y-W, Chang C-J, Lin P-T, Gea H-C, Rutgers University, US

We present an example of making a negative-coefficient material - Negative Poisson’s Ratio (NPR) material, which expands in the cross section when stretching. The NPR materials can provide unique characteristics in energy absorption. The NPR [...]