Liao J-C – TechConnect Briefs

Microfluidic T-Form Mixer Utilizing Pressure Disturbances

Ma Y.B., Fields M., Sun C.P., Zhang F.Y., Liao J-C, Li Y., Liao J-C, Churchill B.M., Ho C-M., University of California at Los Angeles, US

A simple solution to mixing problems in micro fluidic systems was presented in this paper. A T-form microfluidic mixer was designed and tested utilizing pressure disturbances. The performance of the mixer was studied through both [...]

Observation of Soft-Breakdown in Ultra-Thin SiO2 Films under Repetitive Ramped Voltage Stress by Using Conductive Atomic Force Microscopy

Wu Y-L, Lin S-T, Liao J-C, National Chi-Nan University, TW

The degradation and breakdown characteristics of ultra-thin SiO2 (Tox = 5 nm) were investigated by using conductive AFM (C-AFM). Repetitive ramped voltage stress (RVS) was applied through the C-AFM tip to the oxide with polarity [...]