The Modeling and Characterization of Nano-Scale MOSFET Resistance
Lee H.J., Lee J-H., Lee J-Y, Lee W.H., Lee H.J., Lee J-H., Lee J-Y, Lee W.H., Lee H.J., Lee J-H., Lee J-Y, Lee W.H., Kang E-S, Kang J-W, Lee H.J., Lee J-H., Lee J-Y, Lee W.H., Byun K.R., Kang E-S, Kang J-W, Hwang H-J., Kwon O-K., Sangmyung University, KR
It has been reported that both the shallow junction and the heavily doped extension as the methods to minimize the off-current and to stabilize the on-current of the sub-90nm scaled device, can solve the short-channel [...]