Jenke M.G. – TechConnect Briefs

Polarisation stabilisation of telecom lasers by minimally-invasive direct-write focused electron beam induced deposition

Utke I., Jenke M.G., Roeling C., Thiesen P.H., Iakovlev V., Sirbu A., Mereuta A., Caliman A., Kapon E., EMPA, Swiss Federal Laboratories for Materials Science and Technology, CH

The possibility to deposit or remove very small amounts of material for tuning purposes on a fully processed micro/nanodevice at the right place, at will, and without damage to surrounding sensitive areas can be very [...]

Characterisation of Electrical Fields of Buried Interdigitated Nanoscale Ti-Electrode Arrays by a Novel Atomic Force Microscopy Measurement Procedure and Their Fabrication by FIB Milling

Jenke M.G., Santschi Ch., Hoffmann P., EPFL (Ecole Polytechnique Fédérale de Lausanne), CH

The fabrication and characterisation of interdigitated titanium nanoelectrode arrays with 500nm and 50nm width and spacing is described in this work. The electrical-field above the fabricated 500nm electrodes can be sensed by means of a [...]