Advanced CryoTEM and Tomography for Two- and Three-Dimensional Nano-Characterisation of Soft Matter
Sourty E., de Haas F., Frederik P.M., Frederik P.M., Loos J., Stokes D.J., Hubert D.H.W., FEI Company, NL
Recent advances in transmission electron microscopy (TEM) mean that we are able to achieve unprecedented resolution at the atomic level. Furthermore, improved methods for obtaining and reconstructing tilt series projections allow us to create high [...]