Dinelli F. – TechConnect Briefs

Mapping nanomechanical phenomena of graphene nanostructures using force modulation and ultrasonic force microscopy

Kolosov O.V., Kay N.D., Robinson B.J., Rosamond M., Zeze D., Dinelli F., Lancaster University, UK

Whereas graphene electronic properties are extensively studied, mechanical properties of graphene nanostructures are much less experimentally explored even for simple graphene structures. We use a combination of force sensitive scanning probe microscopies that combines low [...]

Seeing the invisible – ultrasonic force microscopy for true subsurface elastic imaging of semiconductor nanostructures with nanoscale resolution

Kolosov O.V., Dinelli F., Krier A., Henini M., Hayne M., Pinque P., Lancaster University, UK

Scanning probe microscopes (SPM’s) are indispensable in modern nanoscale science but ability of SPM’s to look below the surface is unavoidably limited. In spite of developments based on Ultrasonic Force Microscopy (UFM) a true subsurface [...]