Dieing T. – TechConnect Briefs

Towards Automation in the Characterization of Nanostructured Materials and Devices

Weishaupt K., Schmidt U., Dieing T., Hollricher O., WITec GmbH, DE

The characterization of nanostructured materials implies knowledge about their chemical and structural properties, leading to a growing demand for characterization methods for heterogeneous materials on the nanometer scale. However, certain properties are difficult to study [...]

Confocal Raman AFM, a powerful tool for the nondestructive characterization of heterogeneous materials

Schmidt U., Vargas F., Kress M., Dieing T., Weishaupt K., Hollricher O., WITec GmbH, DE

The Confocal Raman-AFM is a breakthrough in microscopy. It combines three measuring techniques in one instrument: a high resolution confocal optical microscope, an extremely sensitive Raman spectroscopy system, and an Atomic Force Microscope (AFM). Using [...]