Dewanto R. – TechConnect Briefs

Reliability Prediction of Single-Crystal Silicon MEMS Using Dynamic Raman Spectroscopy

Dewanto R., Hu Z., Gallacher B., Hedley J., Newcastle University, UK

This paper proposes an extension and improvement to reliability predictions in single-crystal silicon MEMS by utilizing dynamic Raman spectroscopy to allow the gathering process of Weibull fracture test data to be done directly on devices [...]

A Novel Electrical Contacting Technology to Graphene

Ghosh B., Dale C., Dewanto R., Keegan N., Hedley J., Newcastle University, UK

The paper reports on a Ni based electrical contacting technology to graphene that is simple and effective and can be adopted by laboratories lacking high grade infrastructure. The graphene surface is masked, activated and then [...]