Bernthaler T. – TechConnect Briefs

Machine Learning Based Detection and Deep Learning Based Image Inpainting of Preparation Artefacts in Micrographs

Jansche A., Choudhary A.K., Bernthaler T., Schneider G., Aalen University, DE

Artefacts like stains or scratches introduced during the metallographic sample preparation process are a problem for manual as well as automatic image analysis. We show the use of image inpainting – normally used for reconstruction [...]

Machine Learning for Microstructures Classification in Functional Materials

Choudhary A.K., Jansche A., Grubesa T., Bernthaler T., Schneider G., Aalen University, DE

The search for novel magnetic phases requires efficient quantitative microstructure analysis to extract microstructural information and to correlate it with its intrinsic magnetic parameters. Kerr micrographs of magnets hold vital information for analysing the distribution [...]