Ahn J.J. – TechConnect Briefs

Nanoelectronic Structural Information with Scanning Probe Microscopes

Kopanski J., You L., Ahn J.J., Obeng Y., National Institute of Standards and Technology, US

Scanning probe microscopes (SPMs) have remarkable sensitivity to the surface. The atomic force microscope (AFM) can measure surface topography and the scanning tunneling microscope (STM) can interrogate the electrical density of states, both with atomic [...]

A Study on the Novel Type of Ferrofluid Magnetic Pipette

Ahn J.J., Oh J., Choi B., Sogang University, KR

This study was performed to design the novel type of ferrofluid magnetic pipette on a micro scale for the purpose of applications to delivery systems, which is the core device of Lab on a chip [...]