Northwest Normal University – TechConnect Briefs

Detecting CH4 and CO Gases Using Micro-Structural Doping Compound Oxide Films on Si-Substrates

Li Y.F., Ma S.Y., Kish L.B., Ding J.-J., Northwest Normal University, US

Fluctuation-enhanced chemical sensing with commercial gas sensors have already been studied[1-4]. Fig. 1 shows one of the typical fluctuation-enhanced signals of PdxWO3 film sensor. The gas-sensing films used in commercial gas sensors are deposited on [...]

The Effect of Microstructure on I-V Properties in Si/SiO2 Film

Ma S.Y., Ma Z.-J., Ma S.Y., Ma Z.-J., Northwest Normal University, CN

P-type Si(100) wafers with 8~11 Ω•cm resistivity were used as substrates. The Si substrates were put into the magnetron sputtering device (JGP560B), and three kinds of Si/SiO2 film were fabricated using the R.F magnetron sputtering [...]

Influence of Al-Doping on the Optical Properties of ZnO films

Ma S.Y., Chen H.X., Glass J.T., Parker C.B., Northwest Normal University, CN

Al doped ZnO (AZO) thin films were deposited on glass substrates using the radio frequency reactive magnetron sputtering technique. The effect of Al concentration on the microstructure and the luminescence properties of the AZO thin [...]