Sharma S.K., Mohan S.
Indian Institute of Science, Bangalore, IN
Keywords: focused ion beam (FIB) micro-machining, magnetron sputtering, nano-mechanical testing, scanning electron microscopy, shape memory alloys (SMA)
Focused Ion Beam (FIB) micro-machining technique has been used to generate various nano-structures on NiTi shape memory alloy films. The fabrication and nano-mechanical investigations of the nano-structures have been included in this paper.
Journal: TechConnect Briefs
Volume: 2, Nanotechnology 2011: Electronics, Devices, Fabrication, MEMS, Fluidics and Computational
Published: June 13, 2011
Pages: 336 - 339
Industry sectors: Advanced Materials & Manufacturing | Sensors, MEMS, Electronics
Topic: MEMS & NEMS Devices, Modeling & Applications
ISBN: 978-1-4398-7139-3