Index of Keywords

G

• gate dielectrics (1)
• gate electrodes (1)
• gate engineering (2)
• gate induced drain leakage (1)
• gate lag (4)
• gate leakage (1)
• gate length (1)
• gate length scaling effects (1)
• gate length variation (1)
• gate oxide thickness (1)
• gate oxide trap (1)
• gate stack (1)
• gate structure (1)
• gate tunneling (3)
• gate tunneling current (2)
• gate underlap (1)
• gate work function engineering (1)
• gate-all-around (3)
• gate-all-around (GAA) (5)
• gate-all-around (GAA) MOSFET (1)